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Hierarchical Bayesian Reliability Analysis of Binomial Distribution based on Zero-Failure Data

Volume 14, Number 9, September 2018, pp. 2076-2082
DOI: 10.23940/ijpe.18.09.p16.20762082

Shixiao Xiaoa and Haiping Renb

aChengyi University College, Jimei University, Xiamen, 361021, China
bTeaching Department of Basic Subjects, Jiangxi University of Science and Technology, Nanchang, 330013, China

(Submitted on May 12, 2018; Revised on July 23, 2018; Accepted on August 9, 2018)

Abstract:

The aim of this paper is to develop a new hierarchical Bayesian estimation method under symmetric entropy loss function for reliability of the binomial distribution. With the rapid development of manufacturing techniques, some electric products are highly reliable, and thus zero-failure data often occur when putting them in censored lifetime tests. Based on zero-failure data, the reliability analysis is very important for manufacturing. The hierarchical Bayesian estimator is regarded as a robust estimating method, but many existing robust Bayes estimators are complex and difficult to be utilized in practice. The contribution of this article is to present an easy hierarchical Bayesian estimator for reliability of the binomial distribution when reliability has a negative log-gamma prior distribution. Finally, a practical example is provided to show the feasibility and robustness of different estimators.

 

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