A Competing Risks Model with Degradation Phenomena and Catastrophic Failures
Volume 10, Number 1, January 2014 - Paper 7 - pp. 63-74
JI HWAN CHA1, MAURIZIO GUIDA2,3 and GIANPAOLO PULCINI31 Department of Statistics, Ewha Womans University, Seoul 120-750, KOREA
2 Department of Electrical Engineering, Computer Engineering, and Applied Mathematics, University of Salerno, Fisciano (SA), 84084 ITALY
3 Istituto Motori, CNR, Napoli, 80125 ITALY
(Received on February 22, 2013, revised on May 22, 2013)
This paper proposes a competing risks model for the reliability analysis of units subject both to degradation phenomena and catastrophic failures. The paper is mainly addressed to the analysis of real data presented in Huang and Askin (2003) which refer to some electronic devices subject to two independent failure modes. The first mode is the light intensity degradation, which is treated as a degradation phenomenon since the light intensity is observed and measured at given inspection times. The other failure mode is the solder/Cu pad interface fracture, which is classified as a catastrophic failure. The main reliability characteristics, such as the probability density functions and the cumulative distribution functions of each failure mode in the presence of both modes, are estimated. Likewise, the estimate of the hazard function, of the unit reliability under the competing risks model, and of the proportion of failures caused by each failure mode are derived.
Click here to download the paper.
Please note : You will need Adobe Acrobat viewer to view the full articles.