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Optimal Design for Accelerated Life Testing with Simple Step-Stress Plans
Volume 8, Number 5, September 2012 - SC 36 - pp. 573-577
SCOTT HUNT and XIAOJIAN XUDepartment of Mathematics, Brock University
St. Catharines, ON, L2S 3A1, Canada
(Received on March 14, 2012, revised on April 22, 2012)
This paper presents the optimal design for accelerated life testing (ALT) experiments when step-stress plans with Type I censoring are performed. We adopt a generalized Khamis-Higgins model for the effect of changing stress levels. It is assumed that the lifetime of a test unit follows a Weibull distribution, and both its shape and scale parameters are functions of the stress level. The optimal plan chooses the stress changing time to minimize the asymptotic variance (AVAR) of the Maximum Likelihood Estimator (MLE) of reliability at the use stress level and at a pre-specified time.
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