Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test
DAEIL KWON1, MICHAEL H. AZARIAN1, and MICHAEL PECHT1, 2
1 Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD 20742 2 Prognostics and Health Management Center, City University of Hong Kong Kowloon, Hong Kong
DAEIL KWON, MICHAEL H. AZARIAN, and MICHAEL PECHT. Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test [J]. Int J Performability Eng, 2010, 6(5): 443-452.