Application of Grey Prediction Model for Failure Prognostics of Electronics
JIE GU1, NIKHIL VICHARE2, BILAL AYYUB3, and MICHAEL PECHT4
1 Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD 20742, U.S.A. 2 Portables Reliability, Dell Inc., U.S.A 3 Center for Technology and Systems Management (CTSM), University of Maryland U.S.A. 4 Visiting Professor of Electrical Engineering, City University of Hong Kong and Director, CALCE, University of Maryland U.S.A.
JIE GU, NIKHIL VICHARE, BILAL AYYUB, and MICHAEL PECHT. Application of Grey Prediction Model for Failure Prognostics of Electronics [J]. Int J Performability Eng, 2010, 6(5): 435-442.