[1] C. Nie and H. Leung, “A Survey of Combinatorial Testing,” ACM Computing Surveys (CSUR), Vol. 43, No. 2, pp. 11, 2011 [2] R. Kuhn, R. Kacker,Y. Lei, “Combinatorial Software Testing,” Computer, Vol. 42, No. 8, pp. 94-96, 2009 [3] L. S. G.Ghandehari, Y. Lei, T. Xie, D. R. Kuhn, and R. Kacker, “Identifying Failure-Inducing Combinations in a Combinatorial Test Set,” inProceedings of IEEE Fifth International Conference on Software Testing, Verification and Validation, pp. 370-379, Montreal, Canada, April 2012 [4] C. Nie and H. Leung, “The Minimal Failure-Causing Schema of Combinatorial Testing,” ACM Transactions on Software Engineering and Methodology (TOSEM), Vol. 20, No. 4, pp. 15, 2011 [5] B. W. Xu, C. Nie, L. Shi,H. -W. Chen, “A Software Failure Debugging Method based on Combinatorial Design Approach for Testing,” Chinese Journal of Computers-Chinese Edition, Vol. 29, No. 1, pp. 132, 2006 [6] Z. Zhang and J. Zhang, “Characterizing Failure-Causing Parameter Interactions by Adaptive Testing,” inProceedings of the 2011 International Symposium on Software Testing and Analysis, pp. 331-341, Toronto, Canada, July 2011 [7] X. Niu, C. Nie, Y. Lei,A. Chan, “Identifying Failure-Inducing Combinations using Tuple Relationship,” inProceedings of 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops, pp. 271-280, Luxembourg, Luxembourg, March 2013 [8] C. Yilmaz, S. Fouche, M. B. Cohen, et al., “Moving Forward with Combinatorial Interaction Testing,” Computer, Vol. 47, No. 2, pp. 37-45, 2013 [9] C. Yilmaz, M. B. Cohen,A. A. Porter, “Covering Arrays for Efficient Fault Characterization in Complex Configuration Spaces,” IEEE Transactions on Software Engineering, Vol. 32, No. 1, pp. 20-34, 2006 [10] E. Dumlu, C. Yilmaz, M. B. Cohen,A. Porter, “Feedback Driven Adaptive Combinatorial Testing,” inProceedings of the 2011 International Symposium on Software Testing and Analysis, pp. 243-253, Toronto, Canada, July 2011 [11] K. Shakya, T. Xie, N. Li, Y. Lei, R. Kacker,D. R. Kuhn, “Isolating Failure-Inducing Combinations in Combinatorial Testing using Test Augmentation and Classification,” inProceedings of 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, pp. 620-623, Montreal, Canada, April 2012 [12] P. Ammann and J. Offutt, “Introduction to Software Testing,” Cambridge University Press, 2016 [13] J. Han, J. Pei,M. Kamber, “Data Mining: Concepts and Techniques,” Elsevier, 2011 [14] L. S. Ghandehari, J. Chandrasekaran, Y. Lei,L. Sh, “BEN: A Combinatorial Testing-based Fault Localization Tool,” inProceedings of 2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), pp. 1-4, Graz, Austria, April 2015 [15] X. Niu, C. Nie, Y. Lei, K. N. L.Hareton, and X. Wang, “Identifying Failure-Causing Schemas in the Presence of Multiple Faults,” IEEE Transactions on Software Engineering, June 2018 |